Complementary Techniques
Here are links to other chambers or facilities from which we obtain information which complements our CAICISS studies.
- Science City XPS/UPS/ARPES system at Warwick
- Medium energy ion scattering (MEIS).
- XPS at the National Centre for Electron Spectroscopy and Surface Analysis (NCESS).
- Scanning tunnelling microscopy (STM)
- AFM, TEM and SEM in the Warwick Microscopy Group
- Molecular beam epitaxy and reflection high energy electron diffraction
